American Airlines has announced that it will implement new scanning technology at New York's JFK Terminal 8 starting at the end of July. The airline, working with the Transportation Security Administration (TSA), will implement 3-D scanning of carry-on luggage to help enhance security and speed up the screening process.
The airline will introduce CT scan machines to this area, which will allow TSA screeners to see contents of the baggage with a three dimensional view. It also gives screeners the ability to rotate the view 360 degrees so that they can get a better look at the contents in the carry-on bags.
American Airlines has stated that this technology significantly improves security and also speeds up the security process. Travelers will be able to leave many more things, if not everything, in their bags before scanning, which will also enhance the travel experience. American Airlines has been testing this technology out at the Phoenix and Boston airports already.
The airline has not revealed how successful the tests have been in the other two airports, but it is assumed that they are going very well if the airline is going to implement a test in one of its busiest hubs. The airline and TSA have both stated that they hope to get this technology in all American airports and in airports around the world to enhance security and improve travel times.
American Airlines has not stated how long the test will run at the JFK airport or if it will conduct additional tests before making these security scans a permanent service.